[2025] INTEGRATED CIRCUIT FABRICATION PROCESS IC TESTING RELIABILITY FAILURE ANALYSIS
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- Description:
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Integrated circuits (ICs) are at the core of today’s technology —
powering smartphones, computers, and industrial systems.
Understanding how ICs are tested, evaluated, and maintained for
reliability is a key foundation for future engineers and technologists.
This eBook, “IC Testing, Reliability and Failure Analysis,” is part of the
Integrated Circuit Fabrication Process learning series. It introduces
students to essential post-fabrication concepts including IC testing,
reliability prediction, degradation behavior, and failure analysis.
To enhance understanding, this eBook integrates interactive learning
elements such as videos for visual demonstration, quizzes for self-
assessment, and illustrations to support conceptual clarity. These
features aim to make learning more engaging, dynamic, and aligned with
real-world semiconductor practices. - Submitted By:
- Md Nor Sirat (webmaster)
- Submitted On:
- 03 Nov 2025
- Downloads:
- 1
- File Version:
- JKE
- File Author:
- Rosfazliszah Binti Zahit, Azlin Binti Yahya, Mohd Faris Bin Hashimuddin
- File HomePage:
- Click to view
- Submitted On:
- 03 Nov 2025
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